Measuring Thin-Film Stress

Wafers are thin pieces of semiconductor material found in electronic and photovoltaic applications. They are mostly formed out of crystalline.

Wafers can have various sizes and diameters. A number of factors exist that alter their shape. When wafers have their full thickness they can withstand any outer influences from affecting their shape.

Thin-films are known as common influencers on wafer bow parameters. K-Space Associates is a leading manufacturer of in-situ and ex-situ tools for monitoring almost every thin-film deposition process to control thin-film stress.

Such tools as the kSA MOS delivers accurate parameters of thin-film stress, which directly influences surface flatness of wafers. Because of the different materials getting in contact with each other, yielding change in their characteristics, measuring thin-film stress is important for ultimate production control, and reduction of defects.

K-Space works with many of the leading manufacturers, and its measurement tools can be found worldwide.

Lukman Nulhakiem

About Lukman Nulhakiem

Chemical Engineer, safety enthusiastic, blogger and internet marketer with experience in chemical industry and industrial product reviews.
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